
Description
Pressure Scanning Electron MicroscopeConfiguration
BNC Connectors Tungsten FilamentOEM Model Description
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S-3400N
CATEGORY
SEM / FIB
Last Verified: Yesterday
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
155229
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Pressure Scanning Electron MicroscopeConfiguration
BNC Connectors Tungsten FilamentOEM Model Description
None ProvidedDocuments
No documents