Description
SEMConfiguration
SEM, Type1, Secondary Electron Detector, Reflection Electron Detector, Maximum Sample Size 200mm�35mm thickness, Turbo-Molecular PumpOEM Model Description
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HITACHI
S-3400N
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
117702
Wafer Sizes:
Unknown
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEMConfiguration
SEM, Type1, Secondary Electron Detector, Reflection Electron Detector, Maximum Sample Size 200mm�35mm thickness, Turbo-Molecular PumpOEM Model Description
None ProvidedDocuments
No documents