Description
SEMConfiguration
SEM, Type1, Secondary Electron Detector, Reflection Electron Detector, Maximum Sample Size 200mm�35mm thickness, Turbo-Molecular PumpOEM Model Description
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HITACHI
S-3400N
Verified
CATEGORY
SEM / FIB
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
117702
Wafer Sizes:
Unknown
Vintage:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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View AllHITACHI
S-3400N
CATEGORY
SEM / FIB
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
117702
Wafer Sizes:
Unknown
Vintage:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEMConfiguration
SEM, Type1, Secondary Electron Detector, Reflection Electron Detector, Maximum Sample Size 200mm�35mm thickness, Turbo-Molecular PumpOEM Model Description
None ProvidedDocuments
No documents