Description
Tencor P-11 Step Height Measurement System - Installed in Clean-room.Configuration
- Long Scan Profiler P-11 Measurement. - Micro Head sr with Orange stylus. - Measurement Range: 13㎛,65㎛,327㎛. - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/sec. - Stylus Force: 1 ~ 50mg. - Motorized X-Y stage (max sample size:254x254mm). - Pentium 233MHz, Ram 31MB & 17" LCD Color Monitor, Windows 3.1. - Utility: Vacuum. - Power: 115V/50HZ, 4A.OEM Model Description
Tencor P-11 is a surface profiling tool designed for R&D applications. It can analyze surface topography over a 205 mm scan length on various surfaces, including semiconductor wafers and printed circuit boards. Its Open Frame configuration allows for measurement scans of large objects.Documents
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KLA
P-11
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
15793
Wafer Sizes:
8"/200mm
Vintage:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
P-11
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
15793
Wafer Sizes:
8"/200mm
Vintage:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Tencor P-11 Step Height Measurement System - Installed in Clean-room.Configuration
- Long Scan Profiler P-11 Measurement. - Micro Head sr with Orange stylus. - Measurement Range: 13㎛,65㎛,327㎛. - Scan Length: 210mm. - Scan Speed : 1㎛ ~ 25 mm/sec. - Stylus Force: 1 ~ 50mg. - Motorized X-Y stage (max sample size:254x254mm). - Pentium 233MHz, Ram 31MB & 17" LCD Color Monitor, Windows 3.1. - Utility: Vacuum. - Power: 115V/50HZ, 4A.OEM Model Description
Tencor P-11 is a surface profiling tool designed for R&D applications. It can analyze surface topography over a 205 mm scan length on various surfaces, including semiconductor wafers and printed circuit boards. Its Open Frame configuration allows for measurement scans of large objects.Documents
No documents