Description
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Automatic Wafer Prober Model UF-3000Lx with standard acc. Including: - Motorized Test Head Docking Kit for ND4 - 1 set -Probe Pad Auto Alignment - 1 set -Probe Mark inspection - 1 set -Needle Cleaning Unit - 1 set - Special Function for Accepting 25 Slot Cassette - 1 set -GP-IB 1/F - 1 set -Wafer LD Reading - 1 set -Test Head Check Function(Needle align interlock) - 1 set -SAPC - 1 set -Hot tempOEM Model Description
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.Documents
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ACCRETECH / TSK
UF3000LX
Verified
CATEGORY
Probers
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
99693
Wafer Sizes:
Unknown
Vintage:
2019
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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View AllACCRETECH / TSK
UF3000LX
Verified
CATEGORY
Probers
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
99693
Wafer Sizes:
Unknown
Vintage:
2019
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Automatic Wafer Prober Model UF-3000Lx with standard acc. Including: - Motorized Test Head Docking Kit for ND4 - 1 set -Probe Pad Auto Alignment - 1 set -Probe Mark inspection - 1 set -Needle Cleaning Unit - 1 set - Special Function for Accepting 25 Slot Cassette - 1 set -GP-IB 1/F - 1 set -Wafer LD Reading - 1 set -Test Head Check Function(Needle align interlock) - 1 set -SAPC - 1 set -Hot tempOEM Model Description
The ACCRETECH / TSK UF3000LX is a probing machine that performs electrical tests of each chip on a wafer, ensuring the quality of semiconductor devices. It is a prober with high-speed probing that targets non-memory devices. High-speed and low-vibration are achieved by adopting the newly developed exclusive XY driving system. Compared with existing products, it has a smaller footprint due to design changes and has reduced power consumption by 10% in consideration for the environment.Documents
No documents