Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Delta Design Summit ATC is a pick-and-place thermal handler specifically designed for manufacturers of microprocessors, graphic processors, and other high-speed, high-power integrated circuits. The Summit series incorporates Delta's proprietary thermal control technology to effectively dissipate the heat generated during testing, enabling the integrated circuits to be tested at their maximum speed and performance. The ATC (Active Thermal Control) and PTC (Passive Thermal Control) models offer efficient heat management, ensuring successful testing under demanding conditions.Documents
No documents
COHU / DELTA DESIGN
SUMMIT ATC
Verified
CATEGORY
Pick and Place
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
100704
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
COHU / DELTA DESIGN
SUMMIT ATC
CATEGORY
Pick and Place
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
100704
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
Delta Design Summit ATC is a pick-and-place thermal handler specifically designed for manufacturers of microprocessors, graphic processors, and other high-speed, high-power integrated circuits. The Summit series incorporates Delta's proprietary thermal control technology to effectively dissipate the heat generated during testing, enabling the integrated circuits to be tested at their maximum speed and performance. The ATC (Active Thermal Control) and PTC (Passive Thermal Control) models offer efficient heat management, ensuring successful testing under demanding conditions.Documents
No documents