Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.Documents
No documents
UNITY SEMICONDUCTOR / HSEB
TMAP-NST
Verified
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
105930
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
UNITY SEMICONDUCTOR / HSEB
TMAP-NST
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
105930
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.Documents
No documents