Description
SSM 150 Auto Spreading Resistance Probe (ASRP) *. Fully refurbished. *. Installed in Clean-room. *. Available Demo Test and InspectionConfiguration
Working *. Process: Spreading resistance probe *. Measurement perfomance: - Resistivity and Dopant concentration - Resistance measurement & Carrier concentration profile analysis in all structures of silicon Resistance: 1 1 to >E10 Resistivity: 10-⁴Ωcm~4x10⁴ Dopant Concentration: >10²¹cm-³ to < 10¹¹cm-³ *. Measurement configuration: - Carrier concentration profile analysis & Depth measurement *. Hardware configuration: - Standard Microscope/Probe Assembly Test Unit - Electronics Cabinet with Probe Unit, Pneumatics Control, etc - Probe subsystem with Anti-Vibration table - Optic Fiber Light Sources and Holder - IBM Computer Package & LCD Color monitor - 110V/50/60Hz *. Software configuration: - Operation System: MS DOS 3.3 - Operation Software: D150 Version 5.12 *. Accessory (Option): - Lapping Machine, N/P Type unit and Probes,QTA/PEN, Gorey-Schnider grinder,Angle dies,others (100)N.P (111)N,P calibration STD setsOEM Model Description
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SSM
150
Verified
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
66031
Wafer Sizes:
Unknown
Vintage:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SSM
150
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
66031
Wafer Sizes:
Unknown
Vintage:
1999
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SSM 150 Auto Spreading Resistance Probe (ASRP) *. Fully refurbished. *. Installed in Clean-room. *. Available Demo Test and InspectionConfiguration
Working *. Process: Spreading resistance probe *. Measurement perfomance: - Resistivity and Dopant concentration - Resistance measurement & Carrier concentration profile analysis in all structures of silicon Resistance: 1 1 to >E10 Resistivity: 10-⁴Ωcm~4x10⁴ Dopant Concentration: >10²¹cm-³ to < 10¹¹cm-³ *. Measurement configuration: - Carrier concentration profile analysis & Depth measurement *. Hardware configuration: - Standard Microscope/Probe Assembly Test Unit - Electronics Cabinet with Probe Unit, Pneumatics Control, etc - Probe subsystem with Anti-Vibration table - Optic Fiber Light Sources and Holder - IBM Computer Package & LCD Color monitor - 110V/50/60Hz *. Software configuration: - Operation System: MS DOS 3.3 - Operation Software: D150 Version 5.12 *. Accessory (Option): - Lapping Machine, N/P Type unit and Probes,QTA/PEN, Gorey-Schnider grinder,Angle dies,others (100)N.P (111)N,P calibration STD setsOEM Model Description
None ProvidedDocuments
No documents