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ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    Documents

    No documents

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: 15 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104576


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology
    Vintage: 0Condition: Used
    Last Verified15 days ago

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: 15 days ago
    listing-photo-88c366d2fa174c5dbb22a6d7999573f8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    104576


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Film Thickness Measurement System
    Configuration
    No Configuration
    OEM Model Description
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    MetrologyVintage: 0Condition: UsedLast Verified:15 days ago