Skip to main content
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
ONTO / RUDOLPH / AUGUST S200
    Description
    S200ETCH FILM THICKNESS MEASUREMENT
    Configuration
    No Configuration
    OEM Model Description
    The S200 is a metrology system designed by Rudolph to meet the challenges of high-yield semiconductor production at 0.18μm and below. It offers the industry’s highest repeatability laser-ellipsometer and a High Repeatability Mode (HRM™) for next-generation gates. The system has a 5x10μm measurement spot, the smallest in the industry, allowing for accurate measurements in test structures three times smaller than those required by other systems. Its unique simultaneous multiple angle of incidence ellipsometry provides accurate measurements, resulting in powerful multi-layer film characterization and superior process control. The S200 also has a high wafer-per-hour throughput, nearly twice that of competing ellipsometers, and long 20-30,000 hour laser lifetimes provide unparalleled system-to-system matching, superior repeatability, and significantly lower maintenance.
    Documents

    No documents

    ONTO / RUDOLPH / AUGUST

    S200

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    78357


    Wafer Sizes:

    8"/200mm


    Vintage:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    Metrology
    Vintage: 2000Condition: Used
    Last VerifiedOver 60 days ago

    ONTO / RUDOLPH / AUGUST

    S200

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-09bd61c9592f458db67bb28d0837c10e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    78357


    Wafer Sizes:

    8"/200mm


    Vintage:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    S200ETCH FILM THICKNESS MEASUREMENT
    Configuration
    No Configuration
    OEM Model Description
    The S200 is a metrology system designed by Rudolph to meet the challenges of high-yield semiconductor production at 0.18μm and below. It offers the industry’s highest repeatability laser-ellipsometer and a High Repeatability Mode (HRM™) for next-generation gates. The system has a 5x10μm measurement spot, the smallest in the industry, allowing for accurate measurements in test structures three times smaller than those required by other systems. Its unique simultaneous multiple angle of incidence ellipsometry provides accurate measurements, resulting in powerful multi-layer film characterization and superior process control. The S200 also has a high wafer-per-hour throughput, nearly twice that of competing ellipsometers, and long 20-30,000 hour laser lifetimes provide unparalleled system-to-system matching, superior repeatability, and significantly lower maintenance.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    MetrologyVintage: 2000Condition: UsedLast Verified:Over 60 days ago
    ONTO / RUDOLPH / AUGUST S200

    ONTO / RUDOLPH / AUGUST

    S200

    MetrologyVintage: 2012Condition: UsedLast Verified:Over 60 days ago