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N & K 3700 RT
    Description
    N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.
    Configuration
    Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.
    OEM Model Description
    None Provided
    Documents

    No documents

    N & K

    3700 RT

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    12889


    Wafer Sizes:

    8"/200mm


    Vintage:

    2004

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
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    N & K 3700 RT

    N & K

    3700 RT

    Metrology
    Vintage: 2004Condition: Used
    Last VerifiedOver 30 days ago

    N & K

    3700 RT

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 30 days ago
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/bf3750fd80ad4b599a4b1499fad2545b_1_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/c31fd85098314b26b5e844125ab2b165_6_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/04a30b45f22c4d87a0d69909adb6840a_2_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/54085677cc724a1ba2ed770dfd96836a_3_mw.jpg
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    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/29e0368e7b88443d85fe3d84781458ba_5_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/efe8fc91d2224d40883ebe333a119d98_9_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/475a3fe6f5b94b5d9f81a5a26e270835_7_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/db1af4d047d441298f1b6cf911b28655_8_mw.jpg
    listing-photo-4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4-FBp2vvoQVhhkHNZmaWZ4UExrln1q9jSLiWNxRYUjs/b3619677694549f5a2b4d29d3ef05b61_10_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    12889


    Wafer Sizes:

    8"/200mm


    Vintage:

    2004


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    N&K 3700 RT Metrology System Broadband spectrometry for film thickness on transparent substrates, including photomask reticles.
    Configuration
    Spotsize: R = 50um, T < 400um The n&k 3700-RT automated system is designed for handling 5” or 6” square masks or up to 8” square samples. These systems can also be configured for transparent wafers. The n&k 3700-RT simultaneously determines thickness, and n and k in the spectral range of 190-1000nm and provide non-destructive, real time, high throughput measurements directly on the device. This system collects reflectance and transmission data (in the spectral range from 190-1000 nm) at the same point and encompasses advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    N & K 3700 RT

    N & K

    3700 RT

    MetrologyVintage: 2004Condition: UsedLast Verified: Over 30 days ago