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KOBELCO / LEO LTA 700
    Description
    Wafer Lifetime Mesurement System
    Configuration
    No Configuration
    OEM Model Description
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    Documents

    No documents

    KOBELCO / LEO

    LTA 700

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115092


    Wafer Sizes:

    6"/150mm


    Vintage:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    Metrology
    Vintage: 1997Condition: Used
    Last VerifiedOver 30 days ago

    KOBELCO / LEO

    LTA 700

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 30 days ago
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/b239050e45e341d18aa4e32aba9b4812_1_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/a3b504f56c2d4fb88049bfd15a6c02c0_2_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/9d9421b46e8c4fc4afa008a844b24da5_3_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61f1cc918d2b44569d801ed69261bb47_4_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/5e528d6f8bf94c6c8b3b368ff85bfc7b_5_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/c294cb1c75534416b51abf1c04237488_6_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61cf7ad28bd9451f830f20504beea2ff_7_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/70e6c6972f8f43939b979e81298a41b6_8_mw.png
    listing-photo-4b1de30760c742ccbe514008c6f6f840-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/4b1de30760c742ccbe514008c6f6f840/61d9742724ae4ad78c0f9a56ff055ade_9_mw.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115092


    Wafer Sizes:

    6"/150mm


    Vintage:

    1997


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Wafer Lifetime Mesurement System
    Configuration
    No Configuration
    OEM Model Description
    LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.
    Documents

    No documents

    Similar Listings
    View All
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    MetrologyVintage: 1997Condition: UsedLast Verified:Over 30 days ago
    KOBELCO / LEO LTA 700

    KOBELCO / LEO

    LTA 700

    MetrologyVintage: 1997Condition: UsedLast Verified:Over 60 days ago