Description
LEO/KOBELCO LTA-700 Wafer Lifetime Measure Variable Injection Type Wafer Lifetime Measuring System.Configuration
No ConfigurationOEM Model Description
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.Documents
No documents
KOBELCO / LEO
LTA 700
Verified
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
12654
Wafer Sizes:
6"/150mm
Vintage:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KOBELCO / LEO
LTA 700
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
12654
Wafer Sizes:
6"/150mm
Vintage:
1997
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
LEO/KOBELCO LTA-700 Wafer Lifetime Measure Variable Injection Type Wafer Lifetime Measuring System.Configuration
No ConfigurationOEM Model Description
LTA-700 is a variable injection type wafer lifetime measuring system designed to assess the carrier recombination lifetime in semiconductor wafers. This measurement is crucial for evaluating the quality and performance of silicon wafers used in semiconductor devices. The system operates based on the Microwave PhotoConductivity Decay (μ-PCD) method, where a laser injects carriers into the wafer, and the subsequent decay is monitored using a microwave antenna detector. This approach allows for precise lifetime measurements, aiding in the development and quality control of semiconductor materials.Documents
No documents