Description
Surface Charge MeasurementConfiguration
No ConfigurationOEM Model Description
Quantox® is a metrology system designed to measure the electrical performance of gate dielectric films in integrated circuits. The quality of the gate dielectric is crucial for the speed and reliability of the circuit. By measuring key parameters such as contamination levels and oxide thickness, Quantox® helps to control the gate dielectric process and maximize device yield. The system is non-contact, ensuring accurate and reliable measurements.Documents
No documents
KLA
QUANTOX
CATEGORY
Metrology
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
151542
Wafer Sizes:
12"/300mm
Vintage:
2004
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Surface Charge MeasurementConfiguration
No ConfigurationOEM Model Description
Quantox® is a metrology system designed to measure the electrical performance of gate dielectric films in integrated circuits. The quality of the gate dielectric is crucial for the speed and reliability of the circuit. By measuring key parameters such as contamination levels and oxide thickness, Quantox® helps to control the gate dielectric process and maximize device yield. The system is non-contact, ensuring accurate and reliable measurements.Documents
No documents