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KLA ARCHER AIM
    Description
    No description
    Configuration
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    OEM Model Description
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
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    KLA

    ARCHER AIM

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    49248

    Wafer Sizes:

    12"/300mm

    Vintage:

    2003

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    KLA ARCHER AIM
    KLAARCHER AIMMetrology
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    Last VerifiedOver 60 days ago
    KLA ARCHER AIM
    KLAARCHER AIMMetrology
    Vintage: 2004Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    ARCHER AIM

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    listing-photo-43625f203abe414686d7b2005cb2411c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    49248

    Wafer Sizes:

    12"/300mm

    Vintage:

    2003

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    Archer AIM is an Advanced Optical Overlay Metrology product that improves stepper correction accuracy, provides precise data, and enables design rule segmentation. It delivers industry-leading precision performance, reduces total measurement uncertainty, and increases sampling rate. It also includes offline automatic recipe creation and real-time analysis software. The MPX option enables ‘on product’ monitoring of focus-exposure. Archer AIM targets new standards for lithography process control for 65-nm and beyond, reducing measurement uncertainty and enabling control of overlay error budgets. It integrates with KLA-Tencor’s software management products to provide comprehensive optical overlay metrology process control.
    Documents

    No documents

    Similar Listings
    View All
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    MetrologyVintage: 0Condition: UsedLast Verified: Over 60 days ago
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    MetrologyVintage: 2003Condition: UsedLast Verified: Over 60 days ago
    KLA ARCHER AIM
    KLA
    ARCHER AIM
    MetrologyVintage: 2004Condition: UsedLast Verified: Over 60 days ago