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KLA SpectraCD-XT
    Description
    No description
    Configuration
    Model: SpectraCD-XTS+ N40~013
    OEM Model Description
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    Documents

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    KLA

    SpectraCD-XT

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    14632

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

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    KLA SpectraCD-XT
    KLASpectraCD-XTMetrology
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    SpectraCD-XT

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    listing-photo-B1580su3y8x5voF6EpKuZ9uqvQ-5myxfWsN6KJEfRP4-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    14632

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Model: SpectraCD-XTS+ N40~013
    OEM Model Description
    In February 2006, KLA introduced the SpectraCD-XT—our fourth-generation of inline optical CD metrology systems for advanced patterning process control at the 90nm and 65nm nodes. SpectraCD-XT is a non-destructive dedicated CD and profile metrology system built on our high-throughput, production-proven Archer platform. The tool is the only high performance spectroscopic ellipsometry (SE)-based
    Documents

    No documents

    Similar Listings
    View All
    KLA SpectraCD-XT
    KLA
    SpectraCD-XT
    MetrologyVintage: 0Condition: UsedLast Verified: Over 60 days ago