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KLA RS75/TCA
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The OmniMap® RS75 series is a tool designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. The RS75 series is offered in a variety of configurations to meet customer production requirements, including automated and manual versions, both of which are available with or without temperature compensation. Models include the Auto RS75/tc, RS75/tc, Auto RS75, and the RS75.
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    KLA

    RS75/TCA

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    61946


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    KLA RS75/TCA
    KLARS75/TCAMetrology
    Vintage: 0Condition: Refurbished
    Last VerifiedOver 60 days ago

    KLA

    RS75/TCA

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    listing-photo-bed6f62b67724ce787b402a2748867fc-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Refurbished


    Operational Status:

    Unknown


    Product ID:

    61946


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The OmniMap® RS75 series is a tool designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. The RS75 series is offered in a variety of configurations to meet customer production requirements, including automated and manual versions, both of which are available with or without temperature compensation. Models include the Auto RS75/tc, RS75/tc, Auto RS75, and the RS75.
    Documents

    No documents

    Similar Listings
    View All
    KLA RS75/TCA
    KLA
    RS75/TCA
    MetrologyVintage: 0Condition: RefurbishedLast Verified: Over 60 days ago