Description
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive indexConfiguration
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM Model Description
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.Documents
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KLA / FILMETRICS
F20
Verified
CATEGORY
Metrology
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65744
Wafer Sizes:
Unknown
Vintage:
2021
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KLA / FILMETRICS
F20
CATEGORY
Metrology
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65744
Wafer Sizes:
Unknown
Vintage:
2021
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive indexConfiguration
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM Model Description
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.Documents
No documents