Description
No descriptionConfiguration
ResMap Four Point Probe Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange - 1m to 10M Accuracy 0.5% 0.02% static, 0.1% dynamic Measurement unit size: 12”W x 10”H x 18”D Full functional unit Included: Measurement unit, computer, Keyboard/mouse,monitor.OEM Model Description
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).Documents
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CDE
ResMap 178
Verified
CATEGORY
Metrology
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68125
Wafer Sizes:
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
Unknown
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
Available
CDE
ResMap 178
Verified
CATEGORY
Metrology
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
68125
Wafer Sizes:
2"/50mm, 4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
ResMap Four Point Probe Manual load “baby” Wafer size: 2”-8” Manual load Max round sample: 8.2” φ , Max square sample:5.8”x5.8” Maximum throughput: 1min/wafer, (49pints) MeasurementRange - 1m to 10M Accuracy 0.5% 0.02% static, 0.1% dynamic Measurement unit size: 12”W x 10”H x 18”D Full functional unit Included: Measurement unit, computer, Keyboard/mouse,monitor.OEM Model Description
The CDE ResMap 178 is a precision instrument for measuring the sheet resistivity of a conductive media (metal and semiconductor applications). It is a table top model with manual wafer load and can measure wafer sizes from 2” to 8”. It has become an industry standard for cost effective resistivity measurement. The CDE ResMap 178 has an accuracy of 0.5% and a repeatability of 0.02% static and 0.1% dynamic. The CDE ResMap 178 has a resistivity range of 2mOhm/Square to 5MOhm/square. The CDE ResMap 178 has a maximum throughput of 1 minute per wafer (49 sites).Documents
No documents