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CAMECA IMS-4F
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    Documents
    File icon

    Cameca IMS 4F.pdf

    CAMECA

    IMS-4F

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    59344

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    Similar Listings
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    CAMECA IMS-4F

    CAMECA

    IMS-4F

    Metrology
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    CAMECA

    IMS-4F

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/6027a6c6966e452c84838e38578e628e_labspettrometriamassaionisecondarifig1_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/7018c249ae3a4cb89a782aa35ba9ca62_labspettrometriamassaionisecondarifig2_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/5fc16fa72d9a45638a4b5862c3cbd5ca_labspettrometriamassaionisecondarifig3_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/f13014b6090a4b92ac6128cf5d69b72b_labspettrometriamassaionisecondarifig7_mw.jpeg
    listing-photo-8fab3bd64df64ed29049afed0b548278-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/49151/8fab3bd64df64ed29049afed0b548278/ab7df4728de24c968735e271aaf17ccd_1902f26f8f1844638b6c54599010528a1201a_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    59344

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Cameca IMS 4F is the successor to the IMS 3F and contains all the features of its predecessor plus improvements of the basic instrument as well as new accessories. It is an ion microprobe that is based on the phenomenon of ion-induced sputtering of a solid sample by an energetic primary ion beam, typically consisting of oxygen or cesium ions at beam energy of 5 – 20 keV. It is a tool for investigating isotopic composition in the chemical, material, geological and biological sciences and can detect all elements (H to U) in depth profiling, surface, bulk and microanalysis modes.
    Documents
    File icon

    Cameca IMS 4F.pdf

    Similar Listings
    View All
    CAMECA IMS-4F

    CAMECA

    IMS-4F

    MetrologyVintage: 0Condition: UsedLast Verified: Over 60 days ago