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ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
    Description
    Concentration
    Configuration
    PL Mapping
    OEM Model Description
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    Documents

    No documents

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    112393

    Wafer Sizes:

    12"/300mm

    Vintage:

    2000

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Metrology
    Vintage: 2000Condition: Used
    Last VerifiedOver 60 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Metrology
    Vintage: 2002Condition: Used
    Last VerifiedOver 60 days ago

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    112393

    Wafer Sizes:

    12"/300mm

    Vintage:

    2000

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Concentration
    Configuration
    PL Mapping
    OEM Model Description
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    MetrologyVintage: 2000Condition: UsedLast Verified:Over 60 days ago
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    MetrologyVintage: 2002Condition: UsedLast Verified:Over 60 days ago