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(1) Teradyne UltraFLEX-SC 24 Slot Test System (1) Integrated Manipulator (12) Slots Enabled (1) UltraDSP2 Computer (1) TERA1 Workstation (3) UltraPin1600+ 256 Pin Digital Card (6) HSD 128 Pin Enable License (6) HSD 128 pin 400Mbps License (6) HSD 128 pin 64/128/256M PATN DEPTH License (6) HSD 128 pin SCAN License (1) UP1600 PA N-WIRE System Wide License (4) HexVS (1) UltraVS256+ High Accuracy (1) RTU License & License Transfer FeeOEM Model Description
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.Documents
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TERADYNE
UFLEX-SC
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
76129
Wafer Sizes:
Unknown
Vintage:
Unknown
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TERADYNE
UFLEX-SC
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
76129
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
(1) Teradyne UltraFLEX-SC 24 Slot Test System (1) Integrated Manipulator (12) Slots Enabled (1) UltraDSP2 Computer (1) TERA1 Workstation (3) UltraPin1600+ 256 Pin Digital Card (6) HSD 128 Pin Enable License (6) HSD 128 pin 400Mbps License (6) HSD 128 pin 64/128/256M PATN DEPTH License (6) HSD 128 pin SCAN License (1) UP1600 PA N-WIRE System Wide License (4) HexVS (1) UltraVS256+ High Accuracy (1) RTU License & License Transfer FeeOEM Model Description
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.Documents
No documents