Description
Includes full passing diagnostics on final inspection.Configuration
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM Model Description
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.Documents
No documents
TERADYNE
UFLEX-SC
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
77340
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
TERADYNE
UFLEX-SC
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
77340
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Includes full passing diagnostics on final inspection.Configuration
Teradyne UFlex-SC with: (3) UP1600 (4) HexVS+ (1) HDVS Tera 1 Ultra DPS2 License: 200mbps x 12 UP1600, 512MLVM x 12 UP1600, 256 Pattern memory, Scan license.OEM Model Description
UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.Documents
No documents