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COHU / LTX-CREDENCE SAPPHIRE
    Description
    Wafer Tester Unit
    Configuration
    No Configuration
    OEM Model Description
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    Documents

    No documents

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon

    Verified

    CATEGORY
    Final Test

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113022


    Wafer Sizes:

    12"/300mm


    Vintage:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test
    Vintage: 2007Condition: Used
    Last VerifiedOver 60 days ago

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon
    Verified
    CATEGORY
    Final Test
    Last Verified: Over 30 days ago
    listing-photo-4a6022818fc241109825e0241a35e744-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113022


    Wafer Sizes:

    12"/300mm


    Vintage:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Wafer Tester Unit
    Configuration
    No Configuration
    OEM Model Description
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    Documents

    No documents

    Similar Listings
    View All
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 2007Condition: UsedLast Verified:Over 60 days ago
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 0Condition: UsedLast Verified:Over 60 days ago
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 0Condition: UsedLast Verified:26 days ago