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Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM Model Description
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.Documents
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Verified
CATEGORY
Final Test
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
144985
Wafer Sizes:
Unknown
Config / Diag File:
No
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
SAPPHIRE
CATEGORY
Final Test
Last Verified: 8 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
144985
Wafer Sizes:
Unknown
Config / Diag File:
No
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Part Number: 97152822 • Revision: REV 3 • Description: High-density pogo pin interface board featuring multiple vertical daughter cards (blades). • Architecture: Modular slot-based design. The assembly contains approximately 20 signal/power cards designed for high-parallelism testing. • Applications: Mixed-signal testing, power management ICs (PMIC), and consumer microcontrollers.OEM Model Description
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.Documents
No documents