SAPPHIRE
Category
Final TestOverview
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
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COHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: 2007Condition: UsedLast VerifiedOver 60 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: Condition: UsedLast VerifiedOver 60 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: Condition: UsedLast VerifiedOver 30 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: Condition: UsedLast VerifiedOver 60 days ago
COHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: 2006Condition: UsedLast VerifiedOver 60 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: 2006Condition: UsedLast VerifiedOver 60 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: Condition: UsedLast VerifiedOver 60 days agoCOHU / LTX-CREDENCE
SAPPHIRE
Final TestVintage: Condition: UsedLast VerifiedOver 60 days ago