Description
Logic and Memory functional testerConfiguration
Logic and Memory functional testerOEM Model Description
The VERIGY V93000 is an advanced semiconductor test platform featuring a scalable architecture, capable of testing a broad spectrum of devices. From low-cost IoT devices to high-end components like advanced automotive devices and highly integrated multicore processors, the V93000 offers comprehensive testing capabilities. The platform's universal pin architecture on the PS1600 and AVI64 cards, along with highly integrated RF and mixed signal cards, and best-in-class DPS and VI cards, contribute to increased test coverage, faster time-to-market, and improved test economics.Documents
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ADVANTEST / VERIGY
V93000
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
90880
Wafer Sizes:
Unknown
Vintage:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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Similar Listings
View AllADVANTEST / VERIGY
V93000
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
90880
Wafer Sizes:
Unknown
Vintage:
2011
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Logic and Memory functional testerConfiguration
Logic and Memory functional testerOEM Model Description
The VERIGY V93000 is an advanced semiconductor test platform featuring a scalable architecture, capable of testing a broad spectrum of devices. From low-cost IoT devices to high-end components like advanced automotive devices and highly integrated multicore processors, the V93000 offers comprehensive testing capabilities. The platform's universal pin architecture on the PS1600 and AVI64 cards, along with highly integrated RF and mixed signal cards, and best-in-class DPS and VI cards, contribute to increased test coverage, faster time-to-market, and improved test economics.Documents
No documents