Verigy provides advanced semiconductor test systems and solutions used by leading companies worldwide in design validation, characterization, and high-volume manufacturing test. Verigy offers scalable platforms for a wide range of system-on-chip (SOC) test solutions, and memory test solutions for Flash, DRAM including high-speed memories, as well as multi-chip packages (MCP). Verigy also provides advanced analysis tools that accelerate design debug and yield ramp processes.

The VERIGY V93000 is an advanced semiconductor test platform featuring a scalable architecture, capable of testing a broad spectrum of devices. From low-cost IoT devices to high-end components like advanced automotive devices and highly integrated multicore processors, the V93000 offers comprehensive testing capabilities. The platform's universal pin architecture on the PS1600 and AVI64 cards, along with highly integrated RF and mixed signal cards, and best-in-class DPS and VI cards, contribute to increased test coverage, faster time-to-market, and improved test economics.

ADVANTEST / VERIGY

V93000

The Agilent 93000, also known as VERIGY 93000, is a versatile and scalable system-on-a-chip (SOC) testing platform. It serves as a single solution with flexible upgradeability, covering a wide range of applications, including digital, analog, and embedded memory testing. 

93000

Versatest V5000 Series platform, designed to test memory devices, including flash memory and multi-chip packages. We believe our products are especially well-equipped to address the growing challenges in today's semiconductor market.

V5000

The Versatest Series V4000 memory testers.

V4000

The Versatest Series V4400 memory testers.
High parallelism for all memory devices.


V4400

83000

The HP 94000IP photo-image-testing system, part of the HP 94000 family of mixed-signal production-test systems, captures up to 50 two-megapixel frames (more than two million pixels) to meet the needs of next-generation digital imaging products.
Depending on their density, CMOS (Complementary Metal Oxide Semiconductor) chips are expected to cost 40 percent to 50 percent less than today's widely used charge-coupled devices (CCD), and can be tested at speeds ranging from 20MHz to 40MHz.

94000IP

V3300

The VERIGY P1000 is a performance-optimized SOC (System-on-a-Chip) test system, specifically designed for testing infrastructure devices. It offers high-performance capabilities for rigorous testing requirements in this domain. Overall, the VERIGY P1000 is a powerful and flexible test system catering to infrastructure devices, ensuring precise and efficient testing to meet the demands of the semiconductor industry.

 P1000

The performance optimized models P1000, P800, and P600 are best suited in testing infrastructure devices. 

P600

The Verigy V6000e is the industry’s first engineering test solution for Flash and DRAM applications with Active Matrix technology for the office environment. Part of the V6000 family, the V6000e brings to the lab or office setting the same powerful testing capabilities of the production V6000 WS and FT systems. 

V6000E

V1000

The VERIGY V5400 is an advanced memory test system specifically designed to test flash memory devices. Its primary purpose is to ensure the reliability of flash memory as storage capacity increases and physical size decreases. This powerful test system offers comprehensive testing capabilities, making it an essential tool for semiconductor manufacturers seeking to verify and validate the performance and quality of their flash memory devices.

V5400

Channel count: 64 channels per logic board
Maximum 256 channels for one system
Parallelism: maximum 8-site
Scalability: different kinds of the board can
be mixed and installed on the system
Signal Docking: 256 channel cable mount

 The V6000 WS and FT, the V6000e is supported by patent-pending Active Matrix technology, which delivers breakthrough cost of test (COT), as well as the scalability and flexibility required to perform both Flash and DRAM testing on the same system. 

 V6000FT

V1200

Versatest V5500 Series system is a highly scalable high-volume production test system configured for final test of packaged devices, and optimized for final test of MCPs. When equipped with our optional Programmable Interface Matrix, it can be scaled to test up to 512 devices and up to 24,576 pins in parallel. Like our other Versatest V5000 Series platforms, the Versatest V5500 Series system performance can test up to 200 Megahertz data rates.

V5500

V2100

V6000

P800

84000

82000

94000

Versatest V5000e Series system is a full function but less expensive and lower volume memory test system designed for use in the research and development environment. It provides engineers a relatively inexpensive test tool for testing small numbers of devices in prototype development that provides all of the functionality of an expensive production test system and can be used to avoid the expense and inefficiency of taking a more expensive, high-volume test system out of production. Programs developed for the Versatest V5000 Series system can be quickly transferred to our Versatest V5400 and V5500 Series systems for high volume production, helping shorten customers' time to market.

V5000E

The Versatest Series V4100 memory testers

V4100

V101 platform, introduced in the third quarter of fiscal year 2009, designed to test highly cost-sensitive devices such as 4, 8 and 16-bit micro-controller units (“MCUs”) and consumer mixed-signal devices.

V101

V1100

The V6000 WS and FT, the V6000e is supported by patent-pending Active Matrix technology, which delivers breakthrough cost of test (COT), as well as the scalability and flexibility required to perform both Flash and DRAM testing on the same system. 

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