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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200
    Description
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    OEM Model Description
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

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    Verified

    CATEGORY

    FIB
    Last Verified: 16 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    102853


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPSFIB 200FIB
    Vintage: 0Condition: Used
    Last Verified16 days ago

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    verified-listing-icon

    Verified

    CATEGORY

    FIB
    Last Verified: 16 days ago
    listing-photo-4a5f66823f1942749263203a13ac8c8f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    102853


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
    Documents

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