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UNITY SEMICONDUCTOR / HSEB TMAP-NST
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.
    Documents

    No documents

    UNITY SEMICONDUCTOR / HSEB

    TMAP-NST

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    105930

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    UNITY SEMICONDUCTOR / HSEB TMAP-NST

    UNITY SEMICONDUCTOR / HSEB

    TMAP-NST

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    UNITY SEMICONDUCTOR / HSEB

    TMAP-NST

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-eca351dcef1e4688896b80cffee66c19-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    105930

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.
    Documents

    No documents

    Similar Listings
    View All
    UNITY SEMICONDUCTOR / HSEB TMAP-NST

    UNITY SEMICONDUCTOR / HSEB

    TMAP-NST

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago