Used UNITY SEMICONDUCTOR / HSEB TMAP-NST Equipment | Moov

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Marketplace > Defect Inspection > UNITY SEMICONDUCTOR / HSEB > TMAP-NST

UNITY SEMICONDUCTOR / HSEB

TMAP-NST

Category

Defect Inspection

Overview

The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.

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UNITY SEMICONDUCTOR / HSEB
TMAP-NST
Defect Inspection
Vintage: Condition: Used
Last VerifiedOver 60 days ago

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