Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.Documents
No documents
CATEGORY
Defect Inspection
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
143394
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
UNITY SEMICONDUCTOR / HSEB
TMAP-NST
CATEGORY
Defect Inspection
Last Verified: 17 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
143394
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The TMAP NST is a non contact full field metrology solution based on optical microscopy enabling surface topography measurements at the nano scale.Documents
No documents