Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.Documents
No documents
KLA
CANDELA CS920
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
112452
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS920
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
112452
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Candela CS920 is the first integrated surface and photoluminescence defect detection system for Silicon Carbide wafers. It has a UV laser for high sensitivity to defects and can detect and classify SiC epitaxy layer surface defects and crystal defects. These features help improve epitaxy yield.Documents
No documents