Description
Surface AnalyzerConfiguration
- Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializesOEM Model Description
KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.Documents
KLA
CANDELA CS900
Verified
CATEGORY
Defect Inspection
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
90138
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm
Vintage:
2017
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS900
CATEGORY
Defect Inspection
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
90138
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm
Vintage:
2017
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available