Skip to main content
Moov logo

Moov Icon
KLA CANDELA CS10
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    65379


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA CANDELA CS10

    KLA

    CANDELA CS10

    Defect Inspection
    Vintage: 2009Condition: Used
    Last Verified3 days ago

    KLA

    CANDELA CS10

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-e8a735c643af43d9bc8a76e6a6511cf3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44127/e8a735c643af43d9bc8a76e6a6511cf3/05efc13dfe03464c836d8f4e0c7b9864_d1652b61bf5e463eb0b9d911410e185c45005c_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    65379


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Candela CS10 Optical Surface Analyzer is a compact device that offers exceptional sensitivity to particles and scratches on 2"-12" wafers using dual-laser Optical X-Beam technology. It simultaneously measures phase shift, scattered light, reflected light, and topography to detect and classify wafer surface defects. It is well-suited for laboratory and low volume production applications, and is easy to learn and operate.
    Documents

    No documents

    Similar Listings
    View All
    KLA CANDELA CS10

    KLA

    CANDELA CS10

    Defect InspectionVintage: 2009Condition: UsedLast Verified:3 days ago
    KLA CANDELA CS10

    KLA

    CANDELA CS10

    Defect InspectionVintage: 2009Condition: UsedLast Verified:Over 60 days ago
    KLA CANDELA CS10

    KLA

    CANDELA CS10

    Defect InspectionVintage: 2009Condition: RefurbishedLast Verified:Over 60 days ago