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KLA CANDELA 8600
    Description
    KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The defect detection system's inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings (SiC, GaN, sapphire). *. Fully refurbished. Installed in Clean-room. Can demonstrate anytime.
    Configuration
    KLA-Tencor Candela 8600 Working - Laser: Oblique(50mW, 405nm), Normal(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Particle detection: smaller than 0.08㎛ on silicon substrate. - Scratch: 0.1㎛ wide, 1~2nm deep. - Pits and Bumps: 20㎛ diameter, 50Å;; deep. - Stains: 20㎛ diameter, 10Å;; thick. - can be used for both epi and bare substrate. - can be used for Si, GaAs, Al2O3,SiC substrate. - Substrage thickness: 350㎛ ~ 1,300㎛. - Air Balance system ULPA and HEPA air filter(replaced new one). - Input Power 230V 5A 50/60Hz - Input Air: CDA 90 PSI
    OEM Model Description
    None Provided
    Documents

    No documents

    KLA

    CANDELA 8600

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    65982


    Wafer Sizes:

    6"/150mm


    Vintage:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA CANDELA 8600
    KLACANDELA 8600Defect Inspection
    Vintage: 2011Condition: Used
    Last VerifiedOver 30 days ago

    KLA

    CANDELA 8600

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/06e7ad43f5844f2ea86fddf81856f462_1_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/6182ff75d83347779a5e2aaff5fa9110_2_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/bf416103d4da474aa954c833703d27b6_004_mw.jpg
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    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/8108265427a24e6ab35e451b2d0bea89_5_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/a67304172d5c4adbab524d289b334133_3_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/76656571f7cc47c39ecba70a60c91818_4_mw.png
    listing-photo-cbc0be129ab94d6dbe2d74064ef5e7f5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/cbc0be129ab94d6dbe2d74064ef5e7f5/badaa87e260d4250bafc010a49670703_006_mw.jpg
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    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    65982


    Wafer Sizes:

    6"/150mm


    Vintage:

    2011


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    KLA-Tencor Candela 8600 Optical Surface Analyzer (OSA) is a laser-based inspection system for semiconductor and optoelectronic wafers. It is manual wafer handling tool. The Candela defect detection system simultaneously measures surface reflectivity and topography for automatic defect detection and classification. The defect detection system's inspection technology combines scatterometry, ellipsometry, reflectometry, and topographical analysis to non-destructively inspect wafer surfaces for defects, and film thickness uniformity, of opaque substrates, epi layers, and transparent film coatings (SiC, GaN, sapphire). *. Fully refurbished. Installed in Clean-room. Can demonstrate anytime.
    Configuration
    KLA-Tencor Candela 8600 Working - Laser: Oblique(50mW, 405nm), Normal(85mW, 660nm) - Spot size: 5㎛ x 4㎛. - Particle detection: smaller than 0.08㎛ on silicon substrate. - Scratch: 0.1㎛ wide, 1~2nm deep. - Pits and Bumps: 20㎛ diameter, 50Å;; deep. - Stains: 20㎛ diameter, 10Å;; thick. - can be used for both epi and bare substrate. - can be used for Si, GaAs, Al2O3,SiC substrate. - Substrage thickness: 350㎛ ~ 1,300㎛. - Air Balance system ULPA and HEPA air filter(replaced new one). - Input Power 230V 5A 50/60Hz - Input Air: CDA 90 PSI
    OEM Model Description
    None Provided
    Documents

    No documents

    Similar Listings
    View All
    KLA CANDELA 8600
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    CANDELA 8600
    Defect InspectionVintage: 2011Condition: UsedLast Verified: Over 30 days ago
    KLA CANDELA 8600
    KLA
    CANDELA 8600
    Defect InspectionVintage: 2011Condition: UsedLast Verified: Over 30 days ago