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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA AIT XUV
    Description
    Its about 20 years old.
    Configuration
    No Configuration
    OEM Model Description
    The AIT XUV is KLA-Tencor’s next-generation double-darkfield optical inspection tool. It offers higher throughput and sensitivity for 65-nm production requirements, with a wide range of spot sizes and advanced detection algorithms. It also features an auto-positioning system, autofocus unit, and iADC capability for faster results. It is field upgradeable from the AIT UV platform and provides detection capability for current-layer defects at speeds up to three times faster than the prior-generation AIT XP system, with improved focus, tracking performance, and die-to-die registration.
    Documents

    No documents

    KLA

    AIT XUV

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Idle


    Product ID:

    116495


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA AIT XUV

    KLA

    AIT XUV

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago

    KLA

    AIT XUV

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-e55abb315220457da321135ee277255d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73082/e55abb315220457da321135ee277255d/9802d086e7b042b1b2994035b48ce217_74575bbc43ad4b8597630c211fb848ec1201a_mw.jpeg
    listing-photo-e55abb315220457da321135ee277255d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73082/e55abb315220457da321135ee277255d/5381b89fa5b34ec69a3cdb1bb8ce9dc1_c53082ab67934af7b4e365714c658214_mw.jpeg
    listing-photo-e55abb315220457da321135ee277255d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73082/e55abb315220457da321135ee277255d/f3db50393b3e44b6b7d989c00d290ae1_ae9cacd798054d37b3c32f44480102dc1201a_mw.jpeg
    listing-photo-e55abb315220457da321135ee277255d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73082/e55abb315220457da321135ee277255d/479aa15cb94844bb9ca7ebe5f991d014_15c2c868a1594dc5837487b7ce8f8c291201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Idle


    Product ID:

    116495


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Its about 20 years old.
    Configuration
    No Configuration
    OEM Model Description
    The AIT XUV is KLA-Tencor’s next-generation double-darkfield optical inspection tool. It offers higher throughput and sensitivity for 65-nm production requirements, with a wide range of spot sizes and advanced detection algorithms. It also features an auto-positioning system, autofocus unit, and iADC capability for faster results. It is field upgradeable from the AIT UV platform and provides detection capability for current-layer defects at speeds up to three times faster than the prior-generation AIT XP system, with improved focus, tracking performance, and die-to-die registration.
    Documents

    No documents

    Similar Listings
    View All
    KLA AIT XUV

    KLA

    AIT XUV

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 30 days ago
    KLA AIT XUV

    KLA

    AIT XUV

    Defect InspectionVintage: 2005Condition: UsedLast Verified:Over 60 days ago
    KLA AIT XUV

    KLA

    AIT XUV

    Defect InspectionVintage: 2005Condition: UsedLast Verified:Over 60 days ago