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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA 2608
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
    Documents

    No documents

    KLA

    2608

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    33123


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA 2608

    KLA

    2608

    Defect Inspection
    Vintage: 1994Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    2608

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-c1f16550f96040448bb895b96cdce1a7-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    33123


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2608

    KLA

    2608

    Defect InspectionVintage: 1994Condition: UsedLast Verified:Over 60 days ago
    KLA 2608

    KLA

    2608

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    KLA 2608

    KLA

    2608

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago