2608
Category
Defect InspectionOverview
The KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
Active Listings
5
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
KLA
2608
Defect InspectionVintage: 1994Condition: UsedLast VerifiedOver 60 days agoKLA
2608
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days agoKLA
2608
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days agoKLA
2608
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago