2608
Category
Defect InspectionOverview
The KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.
Active Listings
4
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- 2608Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- 2608Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- 2608Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- 2608Defect InspectionVintage: 1994Condition: UsedLast VerifiedOver 60 days ago