Description
Defect Data AnalysisConfiguration
Defect detection analysisOEM Model Description
the KLA 2552, and an off-line Review Station, the KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.Documents
No documents
KLA
2552
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
63377
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
Unknown
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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View AllKLA
2552
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
63377
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Defect Data AnalysisConfiguration
Defect detection analysisOEM Model Description
the KLA 2552, and an off-line Review Station, the KLA 2608, provides semiconductor manufacturers with a yield management system sensitive enough for engineering analysis and fast enough for in-line monitoring of the semiconductor manufacturing process.Documents
No documents