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KLA 2351
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
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    KLA

    2351

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    90109

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    KLA 2351
    KLA2351Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    KLA 2351
    KLA2351Defect Inspection
    Vintage: 2002Condition: Used
    Last VerifiedOver 30 days ago

    KLA

    2351

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-de77fe8719874fecb1e69674c9809ade-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    90109

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The KLA / TENCOR 2351 is a Bright-Field Wafer Inspection System. The TENCOR 2351 can be used with 200mm wafer sizes. In July of 2001, an upgrade to the 2350 was introduced, the 2351, which offers enhancements in sensitivity, throughput and ease of use. The KLA 2135 is a wafer inspection system that detects all types of yield-relevant defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and uses advanced sensor and image processing technologies. The 2135 consistently detects the widest range of defects at the speeds required for high-volume wafer production.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2351
    KLA
    2351
    Defect InspectionVintage: 0Condition: UsedLast Verified: Over 60 days ago
    KLA 2351
    KLA
    2351
    Defect InspectionVintage: 2002Condition: UsedLast Verified: Over 30 days ago