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KLA 2139
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    Documents

    No documents

    KLA

    2139

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 26 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114134


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA 2139

    KLA

    2139

    Defect Inspection
    Vintage: 2001Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    2139

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 26 days ago
    listing-photo-ccca63ac361c4d6ab4bff9798138a801-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114134


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2139

    KLA

    2139

    Defect InspectionVintage: 2001Condition: UsedLast Verified:Over 60 days ago
    KLA 2139

    KLA

    2139

    Defect InspectionVintage: 0Condition: UsedLast Verified:26 days ago
    KLA 2139

    KLA

    2139

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago