2139
Category
Defect InspectionOverview
The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
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4
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
KLA
2139
Defect InspectionVintage: 2001Condition: UsedLast VerifiedOver 60 days agoKLA
2139
Defect InspectionVintage: Condition: UsedLast VerifiedOver 30 days agoKLA
2139
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days agoKLA
2139
Defect InspectionVintage: Condition: RefurbishedLast VerifiedOver 60 days ago