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KLA 2139
  • KLA 2139
  • KLA 2139
  • KLA 2139
  • KLA 2139
  • KLA 2139
  • KLA 2139
Description
KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
Configuration
No Configuration
OEM Model Description
The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
Documents
verified-listing-icon

Verified

CATEGORY
Defect Inspection

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

89679


Wafer Sizes:

8"/200mm


Vintage:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

2139

verified-listing-icon
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/cf7d2a0952514d0da7408c95ccad43f0_cdcecd0defeb4c47b2db72340808a0421201a_mw.jpeg
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listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/a566cc43bc02467880dc934de34ef39e_4a79581d04814612a6ffd558b39884fc1201a_mw.jpeg
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listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/c119c44ea68a48a78a9097007a8041b6_f77ccd1482c643ec8c12ecf045d9300e_mw.jpeg
listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/3ce429e423774c52bb06764a7b1901ce_c2173856b0c34bb689c4dc77633495711201a_mw.jpeg
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

89679


Wafer Sizes:

8"/200mm


Vintage:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
Configuration
No Configuration
OEM Model Description
The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
Documents