Description
KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0HzConfiguration
No ConfigurationOEM Model Description
The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.Documents
KLA
2139
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89679
Wafer Sizes:
8"/200mm
Vintage:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
2139
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
89679
Wafer Sizes:
8"/200mm
Vintage:
2001
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available