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KLA 2135
    Description
    No description
    Configuration
    Bright Field
    OEM Model Description
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    Documents

    No documents

    KLA

    2135

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    107381


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA 2135

    KLA

    2135

    Defect Inspection
    Vintage: 1997Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    2135

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-f2becd2547984996970518f94bd69455-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    107381


    Wafer Sizes:

    8"/200mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    Bright Field
    OEM Model Description
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2135

    KLA

    2135

    Defect InspectionVintage: 1997Condition: UsedLast Verified:Over 60 days ago
    KLA 2135

    KLA

    2135

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    KLA 2135

    KLA

    2135

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago