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KLA 2135
    Description
    No description
    Configuration
    MS-DOS
    OEM Model Description
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
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    KLA

    2135

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    89654

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

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    KLA 2135
    KLA2135Defect Inspection
    Vintage: 0Condition: Refurbished
    Last VerifiedOver 60 days ago
    KLA 2135
    KLA2135Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    2135

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-aa147c16af764420b0c7b668a25c1d72-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    89654

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    MS-DOS
    OEM Model Description
    The KLA 2135 is a wafer inspection system that uses advanced technology to detect all types of defects on all process layers with high capture rates. It has a two- to three-times throughput improvement over the earlier model KLA 2132 and delivers unmatched speed and sensitivity for in-line monitoring of advanced processes. It consistently detects the widest range of yield-relevant defects at the speeds required for high-volume wafer production.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2135
    KLA
    2135
    Defect InspectionVintage: 0Condition: RefurbishedLast Verified: Over 60 days ago
    KLA 2135
    KLA
    2135
    Defect InspectionVintage: 0Condition: UsedLast Verified: Over 60 days ago