Description
Bright field detection No missing parts Current Wafer size : 6Configuration
No ConfigurationOEM Model Description
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.Documents
No documents
KLA
2132
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
107068
Wafer Sizes:
6"/150mm, 12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
2132
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
107068
Wafer Sizes:
6"/150mm, 12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Bright field detection No missing parts Current Wafer size : 6Configuration
No ConfigurationOEM Model Description
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.Documents
No documents