Description
Defect DetectorConfiguration
Defect ScanOEM Model Description
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.Documents
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KLA
2132
CATEGORY
Defect Inspection
Last Verified: 28 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136900
Wafer Sizes:
6"/150mm, 8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Defect DetectorConfiguration
Defect ScanOEM Model Description
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.Documents
No documents