Description
Wafer SurfaceInspectionConfiguration
HDDOEM Model Description
In late 1993, KLA introduced the new 2131 model for all pattern inspection which operates at up to twice the speed of the KLA 2130 and with higher sensitivity.Documents
No documents
KLA
2131
Verified
CATEGORY
Defect Inspection
Last Verified: 24 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115260
Wafer Sizes:
6"/150mm
Vintage:
1994
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
2131
CATEGORY
Defect Inspection
Last Verified: 24 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115260
Wafer Sizes:
6"/150mm
Vintage:
1994
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Wafer SurfaceInspectionConfiguration
HDDOEM Model Description
In late 1993, KLA introduced the new 2131 model for all pattern inspection which operates at up to twice the speed of the KLA 2130 and with higher sensitivity.Documents
No documents