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KLA-Tencor 7700 Surfscan Wafer Inspection - Minor parts missing (ex. end effector) - V: 208, A: 20 - Phase 2, Hz: 60OEM Model Description
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.Documents
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KLA
SURFSCAN 7700
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
83853
Wafer Sizes:
Unknown
Vintage:
1995
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
SURFSCAN 7700
Verified
CATEGORY
Defect Inspection
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
83853
Wafer Sizes:
Unknown
Vintage:
1995
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
KLA-Tencor 7700 Surfscan Wafer Inspection - Minor parts missing (ex. end effector) - V: 208, A: 20 - Phase 2, Hz: 60OEM Model Description
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.Documents
No documents