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Description
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KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM Model Description
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.Documents
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Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
44484
Wafer Sizes:
Unknown
Vintage:
Unknown
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Transaction Insured by Moov
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Refurbishment Services
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KLA
eS32
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
44484
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM Model Description
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.Documents
No documents